BS-000005

Plastilina modeling clay

Plastilina modeling clay is used throughout the Breakerspace to fixture and support samples for X-ray diffraction (XRD), optical microscopy, and, in some cases, scanning electron microscopy (SEM). Because the modeling clay contributes to the measured XRD pattern, samples mounted in Plastilina may exhibit a background contribution from the mounting material. The accompanying reference XRD dataset can be used to identify and, where appropriate, account for or subtract the Plastilina contribution during data analysis.